Parallel tensile testing device with integrated shear strain gauge for single crystal silicon micro structure

In order to shorten testing time on tensile-mode fatigue testing of single crystal silicon micro structure, we have developed parallel tensile testing device with integrated strain gauge. This research proposes the parallel tensile fatigue test device integrating shear strain gauge as a load sensor and we aim to realize tensile fatigue test at high load frequency. The high stiffness helps decreasing actuator amplitude and increasing drive frequency, so fatigue testing time will shorten.


  • Database of fracture strength of single crystal silicon
  • Design guideline of MEMS devices with a higher reliability