IRInspector
赤外透過顕微鏡
SCHOTT MORITEX IR-MEMS Inspector
Main Application
Quality inspection, detection and evaluation:
- Wafer bonding void
- Chipping and after dicing
- MEMS device
- Nondestructive side etching measurement for SiO2 sacrificial layer etching
Specification 仕様
See the following URL:
IR-MEMS Inspector
Procedure 利用方法
Operation Training
- Contact Prof. Hirai (hirai@me.kyoto-u.ac.jp) to get a permission of usage.
- Get operation training.
- After operation training, e-mail to Prof. Hirai and Ms. K. Kawano.
On Use
Approved Users
Machine Administrator
★土屋研究室
平井 義和
Photo