In order to shorten testing time on tensile-mode fatigue testing of single crystal silicon micro structure, we have developed parallel tensile testing device with integrated strain gauge. This research proposes the device with integrated shear type strain gauge which has high stiffness and we evaluated the device through tensile testing. The high stiffness helps decreasing actuator amplitude and increasing drive frequency, so fatigue testing time will shorten.
- Database of fracture strength of single crystal silicon
- Design guideline of MEMS devices with a higher reliability
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- K. Yasuda, A. Uesugi, Y. Hirai, T. Tsuchiya, O. Tabata, Integrated shear strain gauge for parallel tensile-mode fatigue testing device, International Symposium on Micro-Nano Science and Technology 2016 (MNST 2016), The University of Tokyo, Japan (16 – 18 Dec. 2016).